FAB SOLUTIONS COMPANY

Fab Solutions Company designs and delivers systems that enable the semiconductor device manufacturers to detect non-visual defects resulting in electrical failures and losses for sub 130nm processes. It offers EBS3000 EB-Scope System for detecting non-visual defects in high aspect ratio contact and via structures; electron beam metrology systems; and FS3000 EB-Scope systems that enables the detection of yield limiting non-visual defects for process development and volume manufacturing with the first application focused on high aspect ratio contact and structures. Fab Solutions Company was founded by Tohru Tsujide in 2002 and is based in Takatsu-ku, Kanagawa.